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OVITO GmbH dislocation extraction algorithm dxa
Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the <t>dislocation</t> network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the <t>DXA</t> analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
Dislocation Extraction Algorithm Dxa, supplied by OVITO GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/dislocation+extraction+algorithm+(dxa)/dislocation+extraction+algorithm++dxa+/pmc12079803-359-8-18
Average 90 stars, based on 1 article reviews
dislocation extraction algorithm dxa - by Bioz Stars, 2026-09
90/100 stars

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1) Product Images from "Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon"

Article Title: Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon

Journal: Journal of Chemical Theory and Computation

doi: 10.1021/acs.jctc.5c00319

Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the dislocation network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the DXA analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
Figure Legend Snippet: Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the dislocation network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the DXA analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.

Techniques Used:

Related Articles

Extraction:

Article Title: Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon.
Article Snippet: .. We also used other analysis methods, including the dislocation extraction algorithm (DXA) proposed by Stukowski,75,76 implemented in OVITO,77 a program that we used for performing structural analyses (PTM, IDS and DXA) and for preparing visualizations. ..

Article Title: Effects of misfit dislocations and dislocation mobility on thermal boundary resistance of PbTe/PbSe interfaces
Article Snippet: We present a molecular dynamics study of the thermal transport properties of PbTe/PbSe (111) and PbTe/PbSe (100) interfaces at room temperature.. The PbTe/ PbSe heterostructures are obtained through simulations of the kinetic processes of direct bonding of PbTe and PbSe crystals.. The atomic-scale dislocation core structures and the misfit dislocation networks in the heterostructures obtained in the simulations are found to closely match experimental data.

Article Title: Study of the microstructure, corrosion behavior, and mechanical properties of AZ91D composites containing various graphene-based nanomaterials
Article Snippet: Incorporating two-dimensional carbon materials into magnesium alloys has notably improved both their mechanical strength and resistance to corrosion.. This study specifically investigated AZ91D composites containing graphene, carboxyl graphene, and graphene oxide, which were synthesized using spark plasma sintering.. Results revealed that AZ91D-0.1 GC exhibited superior mechanical properties, while AZ91D-0.1G showed exceptional resistance to corrosion.

Article Title: Could an amorphous binder Co phase improve the mechanical properties of WC–Co? A study of molecular dynamics simulation
Article Snippet: .. The dislocation extraction algorithm (DXA) in OVITO was used to distinguish the types of dislocations and calculate the length of the dislocation lines. ..

Article Title: Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon
Article Snippet: .. We also used other analysis methods, including the dislocation extraction algorithm (DXA) proposed by Stukowski, , implemented in OVITO, a program that we used for performing structural analyses (PTM, IDS and DXA) and for preparing visualizations. ..

Article Title: Linear complexions directly modify dislocation motion in face-centered cubic alloys
Article Snippet: .. The dislocation extraction algorithm (DXA) in OVITO no longer identifies a continuous dislocation along the linear complexion, but instead finds an array of disconnected full edge and partial mixed character dislocations. ..

Article Title: Interface microstructure effects on dynamic failure behavior of layered Cu/Ta microstructures
Article Snippet: .. The stress–strain plots are created using the Virial stress formulation , and the generated defects (stacking faults, twin faults, dislocations, etc.) are analyzed using a combination of “centrosymmetric parameter” (CSP) , “common neighbor analysis” (CNA) , , “dislocation extraction algorithm” , (DXA) using OVITO and “the crystal analysis tool” (CAT) . ..

Article Title: Maintaining Grain Boundary Segregation-Induced Strengthening Effect in Extremely Fine Nanograined Metals
Article Snippet: .. Information on dislocation line length was extracted from the MD trajectories using the dislocation extraction algorithm (DXA) in OVITO software. ..

Software:

Article Title: Effects of misfit dislocations and dislocation mobility on thermal boundary resistance of PbTe/PbSe interfaces
Article Snippet: We present a molecular dynamics study of the thermal transport properties of PbTe/PbSe (111) and PbTe/PbSe (100) interfaces at room temperature.. The PbTe/ PbSe heterostructures are obtained through simulations of the kinetic processes of direct bonding of PbTe and PbSe crystals.. The atomic-scale dislocation core structures and the misfit dislocation networks in the heterostructures obtained in the simulations are found to closely match experimental data.

Formulation:

Article Title: Interface microstructure effects on dynamic failure behavior of layered Cu/Ta microstructures
Article Snippet: .. The stress–strain plots are created using the Virial stress formulation , and the generated defects (stacking faults, twin faults, dislocations, etc.) are analyzed using a combination of “centrosymmetric parameter” (CSP) , “common neighbor analysis” (CNA) , , “dislocation extraction algorithm” , (DXA) using OVITO and “the crystal analysis tool” (CAT) . ..

Generated:

Article Title: Interface microstructure effects on dynamic failure behavior of layered Cu/Ta microstructures
Article Snippet: .. The stress–strain plots are created using the Virial stress formulation , and the generated defects (stacking faults, twin faults, dislocations, etc.) are analyzed using a combination of “centrosymmetric parameter” (CSP) , “common neighbor analysis” (CNA) , , “dislocation extraction algorithm” , (DXA) using OVITO and “the crystal analysis tool” (CAT) . ..



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Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the <t>dislocation</t> network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the <t>DXA</t> analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
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Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the <t>dislocation</t> network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the <t>DXA</t> analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
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Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the <t>dislocation</t> network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the <t>DXA</t> analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
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Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the dislocation network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the DXA analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.

Journal: Journal of Chemical Theory and Computation

Article Title: Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon

doi: 10.1021/acs.jctc.5c00319

Figure Lengend Snippet: Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the dislocation network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the DXA analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.

Article Snippet: We also used other analysis methods, including the dislocation extraction algorithm (DXA) proposed by Stukowski, , implemented in OVITO, a program that we used for performing structural analyses (PTM, IDS and DXA) and for preparing visualizations.

Techniques: